Sciweavers

315 search results - page 4 / 63
» Automatic generation of high coverage usability tests
Sort
View
DATE
1998
IEEE
92views Hardware» more  DATE 1998»
13 years 11 months ago
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis...
TVLSI
2008
140views more  TVLSI 2008»
13 years 6 months ago
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
Jorge Campos, Hussain Al-Asaad
GECCO
2003
Springer
148views Optimization» more  GECCO 2003»
14 years 5 days ago
Structural and Functional Sequence Test of Dynamic and State-Based Software with Evolutionary Algorithms
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
André Baresel, Hartmut Pohlheim, Sadegh Sad...
ET
1998
52views more  ET 1998»
13 years 6 months ago
Scalable Test Generators for High-Speed Datapath Circuits
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
Hussain Al-Asaad, John P. Hayes, Brian T. Murray
TACAS
2009
Springer
122views Algorithms» more  TACAS 2009»
14 years 1 months ago
Test Input Generation for Programs with Pointers
Software testing is an essential process to improve software quality in practice. Researchers have proposed several techniques to automate parts of this process. In particular, sym...
Dries Vanoverberghe, Nikolai Tillmann, Frank Piess...