90 search results - page 6 / 18 » Automatic generation of synthetic sequential benchmark circu... |
ASPDAC
2006
ACM
14 years 29 days ago
2006
ACM
Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design ...
ATS
2005
IEEE
14 years 18 days ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
ISLPED
2003
ACM
14 years 7 days ago
2003
ACM
The power consumption of a sequential circuit can be reduced by decomposing it into subcircuits which can be turned off when inactive. Power can also be reduced by careful state e...
COR
2008
2008
Observations in using parallel and sequential evolutionary algorithms for automatic software testing
13 years 7 months ago
In this paper we analyze the application of parallel and sequential evolutionary algorithms (EAs) to the automatic test data generation problem. The problem consists of automatica...
ISLPED
1997
ACM
13 years 10 months ago
1997
ACM
New measures of peak power in the context of sequential circuits are proposed. This paper presents an automatic procedure to obtain very good lower bounds on these measures as wel...