12745 search results - page 2353 / 2549 » Automating test automation |
151
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
149
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
Graphics-intensive computer games are no longer restricted to highperformance desktops, but are also available on a variety of portable devices ranging from notebooks to PDAs and ...
131
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
122
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
As a prevalent constraint, sharp slew rate is often required in circuit design which causes a huge demand for buffering resources. This problem requires ultra-fast buffering techn...
159
click to vote
DAC
2006
ACM
16 years 5 months ago
2006
ACM
Field programmable dual-Vdd interconnects are effective to reduce FPGA power. Assuming uniform length interconnects, existing work has developed time slack budgeting to minimize p...