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ICCAD
1996
IEEE
121views Hardware» more  ICCAD 1996»
14 years 20 days ago
Identification of unsettable flip-flops for partial scan and faster ATPG
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
ICTAI
1996
IEEE
14 years 20 days ago
Forward-Tracking: A Technique for Searching Beyond Failure
In many applications, such as decision support, negotiation, planning, scheduling, etc., one needs to express requirements that can only be partially satisfied. In order to expres...
Elena Marchiori, Massimo Marchiori, Joost N. Kok
VISUALIZATION
1993
IEEE
14 years 19 days ago
GRASPARC: A Problem Solving Environment Integrating Computation and Visualization
Visualization has proved an e ective tool in the understanding of large data sets in computational science and engineering. There is growing interest today in the development of p...
Ken Brodlie, A. Poon, Helen Wright, L. Brankin, G....
ITC
1992
IEEE
76views Hardware» more  ITC 1992»
14 years 17 days ago
A Small Test Generator for Large Designs
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
Sandip Kundu, Leendert M. Huisman, Indira Nair, Vi...
KR
1992
Springer
14 years 17 days ago
Order of Magnitude Reasoning using Logarithms
Converting complex equations into simpler, more tractable equations usually involves approximation. Approximation is usually done by identifying and removing insignificant terms, ...
P. Pandurang Nayak