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» Balance Testing of Logic Circuits
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ISCAS
1999
IEEE
105views Hardware» more  ISCAS 1999»
13 years 11 months ago
Configuration self-test in FPGA-based reconfigurable systems
An FPGA-based reconfigurable system may contain boards of FPGAs which are reconfigured for different applications and must work correctly. This paper presents a novel approach for...
W. Quddus, Abhijit Jas, Nur A. Touba
ESSCIRC
2011
93views more  ESSCIRC 2011»
12 years 7 months ago
12% Power reduction by within-functional-block fine-grained adaptive dual supply voltage control in logic circuits with 42 volta
— Within-functional-block fine-grained adaptive dual supply voltage control (FADVC) is proposed to reduce the power of CMOS logic circuits. Both process and design variations wi...
Atsushi Muramatsu, Tadashi Yasufuku, Masahiro Nomu...
DATE
2006
IEEE
120views Hardware» more  DATE 2006»
14 years 1 months ago
Soft delay error analysis in logic circuits
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...
Balkaran S. Gill, Christos A. Papachristou, Franci...
IAJIT
2010
84views more  IAJIT 2010»
13 years 6 months ago
A Test Procedure for Boundary Scan Circuitry in PLDs and FPGAs
: A test procedure for testing mainly the boundary scan cells, and testing partially the test access port controller in programmable logic devices, and field programmable gate arra...
Bashar Al-Khalifa
GLVLSI
2010
IEEE
209views VLSI» more  GLVLSI 2010»
14 years 17 days ago
Enhancing debugging of multiple missing control errors in reversible logic
Researchers are looking for alternatives to overcome the upcoming limits of conventional hardware technologies. Reversible logic thereby established itself as a promising directio...
Jean Christoph Jung, Stefan Frehse, Robert Wille, ...