233 search results - page 6 / 47 » Balance Testing of Logic Circuits |
ATS
2005
IEEE
13 years 9 months ago
2005
IEEE
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
ITC
1994
IEEE
13 years 11 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...
ICTAI
2002
IEEE
14 years 12 days ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...