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» Balance Testing of Logic Circuits
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ATS
2004
IEEE
116views Hardware» more  ATS 2004»
13 years 11 months ago
Testing for Missing-Gate Faults in Reversible Circuits
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...
John P. Hayes, Ilia Polian, Bernd Becker
HASE
2007
IEEE
14 years 1 months ago
Advances in Quantum Computing Fault Tolerance and Testing
We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustr...
David Y. Feinstein, V. S. S. Nair, Mitchell A. Tho...
ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
14 years 4 months ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase
DATE
2002
IEEE
126views Hardware» more  DATE 2002»
14 years 13 days ago
Automated Modeling of Custom Digital Circuits for Test
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...
Soumitra Bose
ETS
2011
IEEE
220views Hardware» more  ETS 2011»
12 years 7 months ago
Structural In-Field Diagnosis for Random Logic Circuits
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
Alejandro Cook, Melanie Elm, Hans-Joachim Wunderli...