5604 search results - page 26 / 1121 » Becoming Increasingly Reliable |
HIS
2009
13 years 8 months ago
2009
The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...
ISQED
2011
IEEE
13 years 2 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
CASES
2006
ACM
14 years 4 months ago
2006
ACM
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
MICRO
2008
IEEE
14 years 5 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
DATE
2010
IEEE
14 years 4 months ago
2010
IEEE
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...