5604 search results - page 8 / 1121 » Becoming Increasingly Reliable |
ICCAD
2001
IEEE
14 years 6 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
ICDCN
2011
Springer
13 years 1 months ago
2011
Springer
Abstract. Wireless sensor networks (WSNs) deployed in hostile environments suffer from a high rate of node failure. We investigate the effect of such failure rate on network conn...
ISCA
2012
IEEE
12 years 7 days ago
2012
IEEE
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...
FTDCS
1997
IEEE
14 years 2 months ago
1997
IEEE
Mobile agents offer a new possibility for the development of applications in distributed systems and are no longer a theoretical issue since different architectures for their impl...
ISCC
2008
IEEE
14 years 4 months ago
2008
IEEE
As disk drives become increasingly sophisticated and processing power increases, one of the most critical issues of designing modern disk systems is data reliability. Although num...