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ICCD
2001
IEEE
119views Hardware» more  ICCD 2001»
14 years 7 months ago
A Functional Validation Technique: Biased-Random Simulation Guided by Observability-Based Coverage
We present a simulation-based semi-formal verification method for sequential circuits described at the registertransfer level. The method consists of an iterative loop where cove...
Serdar Tasiran, Farzan Fallah, David G. Chinnery, ...
ICCAD
2005
IEEE
176views Hardware» more  ICCAD 2005»
14 years 7 months ago
Statistical gate sizing for timing yield optimization
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
Debjit Sinha, Narendra V. Shenoy, Hai Zhou
ICSM
2009
IEEE
14 years 4 months ago
A theoretical and empirical study of EFSM dependence
Dependence analysis underpins many activities in software maintenance such as comprehension and impact analysis. As a result, dependence has been studied widely for programming la...
Kelly Androutsopoulos, Nicolas Gold, Mark Harman, ...
IEEEPACT
2006
IEEE
14 years 4 months ago
Region array SSA
Static Single Assignment (SSA) has become the intermediate program representation of choice in most modern compilers because it enables efficient data flow analysis of scalars an...
Silvius Rus, Guobin He, Christophe Alias, Lawrence...
ISSTA
2004
ACM
14 years 3 months ago
Testing of java web services for robustness
This paper presents a new compile-time analysis that enables a testing methodology for white-box coverage testing of error recovery code (i.e., exception handlers) in Java web ser...
Chen Fu, Barbara G. Ryder, Ana Milanova, David Won...