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» Bounded-lifetime integrated circuits
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ISQED
2006
IEEE
94views Hardware» more  ISQED 2006»
15 years 10 months ago
System-Level SRAM Yield Enhancement
It is well known that SRAM constitutes a large portion of modern integrated circuits, with 80% or more of the total transistors being dedicated to SRAM in a typical processor or S...
Fadi J. Kurdahi, Ahmed M. Eltawil, Young-Hwan Park...
PATMOS
2004
Springer
15 years 10 months ago
An Efficient Low-Degree RMST Algorithm for VLSI/ULSI Physical Design
Motivated by very/ultra large scale integrated circuit (VLSI/ULSI) physical design applications, we study the construction of rectilinear minimum spanning tree (RMST) with its maxi...
Yin Wang, Xianlong Hong, Tong Jing, Yang Yang, Xia...
DSD
2003
IEEE
108views Hardware» more  DSD 2003»
15 years 10 months ago
Concurrent Operation Scheduling and Unit Allocation with an Evolutionary Technique
This paper presents a method with an evolutionary approach to some of the tasks of integrated-circuit (IC) design. The work is focused on application-specific integrated circuits ...
Gregor Papa, Jurij Silc
ICES
2001
Springer
117views Hardware» more  ICES 2001»
15 years 9 months ago
A Self-Repairing and Self-Healing Electronic Watch: The BioWatch
Abstract. The Embryonics project is inspired by some of the basic processes of molecular biology, such as the embryonic development of living beings. Transposing these processes in...
André Stauffer, Daniel Mange, Gianluca Temp...
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 8 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka