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» Bounded-lifetime integrated circuits
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DAC
2006
ACM
16 years 5 months ago
Gate sizing: finFETs vs 32nm bulk MOSFETs
FinFET devices promise to replace traditional MOSFETs because of superior ability in controlling leakage and minimizing short channel effects while delivering a strong drive curre...
Brian Swahn, Soha Hassoun
DAC
2006
ACM
16 years 5 months ago
Criticality computation in parameterized statistical timing
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
ICCAD
2006
IEEE
124views Hardware» more  ICCAD 2006»
16 years 1 months ago
Robust system level design with analog platforms
An approach to robust system level mixed signal design is presented based on analog platforms. The bottom-up characterization phase of platform components provides accurate perfor...
Fernando De Bernardinis, Pierluigi Nuzzo, Alberto ...
ISQED
2007
IEEE
150views Hardware» more  ISQED 2007»
15 years 11 months ago
A Design Methodology for Matching Improvement in Bandgap References
Errors caused by tolerance variations and mismatches among components severely degrade the performance of integrated circuits. These random effects in process parameters significa...
Juan Pablo Martinez Brito, Hamilton Klimach, Sergi...
151
Voted
SBCCI
2006
ACM
200views VLSI» more  SBCCI 2006»
15 years 10 months ago
A differential switched-capacitor amplifier with programmable gain and output offset voltage
The design of a low-power differential switched-capacitor amplifier for processing a fully-differential input signal coming from a pressure sensor interface is reported. The circu...
Fabio Lacerda, Stefano Pietri, Alfredo Olmos