1343 search results - page 13 / 269 » Bounded-lifetime integrated circuits |
ICES
2007
Springer
13 years 8 months ago
2007
Springer
Abstract. Fault Tolerance is an increasing challenge for integrated circuits due to semiconductor technology scaling. This paper looks at how artificial evolution may be tuned to ...
TE
2010
13 years 1 months ago
2010
Abstract--As demand increases for circuits with higher performance, higher complexity, and decreased feature size, asynchronous (clockless) paradigms will become more widely used i...
AHS
2007
IEEE
13 years 8 months ago
2007
IEEE
Fault Tolerance is an increasing challenge for integrated circuits due to semiconductor technology scaling. This paper looks at how artificial evolution may be tuned to the creat...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Novel experimental characterization method and circuit modeling for frequency-variant transmission lines are presented. Experimental test patterns are designed and fabricated by u...
CASES
2010
ACM
13 years 4 months ago
2010
ACM
3-D circuit-level integration is a chip fabrication technique in which two or more dies are stacked and combined into a single circuit through the use of vertical electroconductiv...