1343 search results - page 5 / 269 » Bounded-lifetime integrated circuits |
CASES
2008
ACM
13 years 8 months ago
2008
ACM
We introduce the first approach that can actively control multiple hardware intellectual property (IP) cores used in an integrated circuit (IC). The IP rights owner(s) can remotel...
DATE
1997
IEEE
13 years 10 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
ITC
1996
IEEE
13 years 10 months ago
1996
IEEE
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
ITC
1996
IEEE
13 years 10 months ago
1996
IEEE
common use is the distinction into two (abstract) fault models: A new fault modelling scheme for integrated analogue general the "Single Hard Fault Model (SHFM)" and the ...
ICCAD
2009
IEEE
13 years 4 months ago
2009
IEEE
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die va...