6 search results - page 1 / 2 » CROWNE: Current Ratio Outliers with Neighbor Estimator |
DFT
2003
IEEE
14 years 2 days ago
2003
IEEE
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to sc...
DFT
2002
IEEE
13 years 11 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
VTS
2003
IEEE
14 years 2 days ago
2003
IEEE
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
MICCAI
2007
Springer
14 years 7 months ago
2007
Springer
Abstract. This paper introduces an outlier rejection and signal reconstruction method for high angular resolution diffusion weighted imaging. The approach is based on the threshold...
TCSV
2010
13 years 1 months ago
2010
In this paper we propose an edge-directed error concealment (EDEC) algorithm, to recover lost slices in video sequences encoded by flexible macroblock ordering. First, the strong e...