658 search results - page 69 / 132 » Challenges in Physical Chip Design |
SIGMETRICS
2010
ACM
13 years 3 months ago
2010
ACM
Laboratory-based mobile wireless testbeds such as MeshTest and the CMU Wireless Emulator are powerful platforms that allow users to perform controlled, repeatable, mobile wireless ...
ACMDIS
2004
ACM
14 years 2 months ago
2004
ACM
Toolkits and other tools have dramatically reduced the time and technical expertise needed to design and implement graphical user interfaces (GUIs) allowing high-quality, iterativ...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
SIGCOMM
2006
ACM
14 years 2 months ago
2006
ACM
This paper describes VINI, a virtual network infrastructure that allows network researchers to evaluate their protocols and services in a realistic environment that also provides ...
MICRO
2008
IEEE
14 years 3 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...