229 search results - page 10 / 46 » Compaction Schemes with Minimum Test Application Time |
ASPDAC
2007
ACM
14 years 20 hour ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
ETS
2006
IEEE
14 years 2 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
DCOSS
2007
Springer
14 years 2 months ago
2007
Springer
Abstract. We develop a practical, distributed algorithm to detect events, identify measurement errors, and infer missing readings in ecological applications of wireless sensor netw...
SIAMSC
2008
13 years 8 months ago
2008
In this study, nonnegative matrix factorization is recast as the problem of approximating a polytope on the probability simplex by another polytope with fewer facets. Working on th...
ICDE
2009
IEEE
14 years 9 months ago
2009
IEEE
In many applications, we need to analyze a large number of time series. Segments of time series demonstrating dominating advantages over others are often of particular interest. In...