229 search results - page 3 / 46 » Compaction Schemes with Minimum Test Application Time |
DATE
2002
IEEE
14 years 1 days ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
DCC
2008
IEEE
14 years 6 months ago
2008
IEEE
The Range Minimum Query (RMQ) Problem is to preprocess an array A of length n in O(n) time such that subsequent on-line queries asking for the position of a minimal element between...
WWW
2007
ACM
14 years 7 months ago
2007
ACM
As XML database sizes grow, the amount of space used for storing the data and auxiliary data structures becomes a major factor in query and update performance. This paper presents...
ICCAD
2002
IEEE
14 years 1 days ago
2002
IEEE
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...