138 search results - page 15 / 28 » Compaction-based test generation using state and fault infor... |
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
CHES
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. In this paper we describe two differential fault attack techniques against Advanced Encryption Standard (AES). We propose two models for fault occurrence; we could find a...
SSPR
2010
Springer
13 years 5 months ago
2010
Springer
Many approaches to learning classifiers for structured objects (e.g., shapes) use generative models in a Bayesian framework. However, state-of-the-art classifiers for vectorial d...
SIGMOD
2006
ACM
14 years 7 months ago
2006
ACM
Testing of database applications is crucial for ensuring high software quality as undetected faults can result in unrecoverable data corruption. The problem of database applicatio...
DELTA
2008
IEEE
14 years 1 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...