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ITC
2000
IEEE
93views Hardware» more  ITC 2000»
13 years 12 months ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
AAAI
1994
13 years 8 months ago
Case-Based Acquisition of User Preferences for Solution Improvement in Ill-Structured Domains
1 We have developed an approach to acquire complicated user optimization criteria and use them to guide iterative solution improvement. The eectiveness of the approach was tested ...
Katia P. Sycara, Kazuo Miyashita
DAC
1994
ACM
13 years 11 months ago
Dynamic Search-Space Pruning Techniques in Path Sensitization
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
João P. Marques Silva, Karem A. Sakallah
ISSRE
2000
IEEE
13 years 12 months ago
Evaluation of Regressive Methods for Automated Generation of Test Trajectories
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
Brian J. Taylor, Bojan Cukic