550 search results - page 25 / 110 » Complementarity of Error Detection Techniques |
ICPR
2010
IEEE
14 years 1 months ago
2010
IEEE
—We present a meta-learning framework for the design of potential functions for Conditional Random Fields. The design of both node potential and edge potential is formulated as a...
ICDE
2008
IEEE
14 years 9 months ago
2008
IEEE
Errors in estimating page counts can lead to poor choice of access methods and in turn to poor quality plans. Although there is past work in using execution feedback for accurate c...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
On-chip buses are typically designed to meet performance constraints at worst-case conditions, including process corner, temperature, IR-drop, and neighboring net switching patter...
DATE
2002
IEEE
14 years 18 days ago
2002
IEEE
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...
GLVLSI
2008
IEEE
13 years 7 months ago
2008
IEEE
Due to the increasing complexity of today's circuits a high degree of automation in the design process is mandatory. The detection of faults and design errors is supported qu...