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ATS
2003
IEEE
75views Hardware» more  ATS 2003»
14 years 3 months ago
An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
VTS
2003
IEEE
115views Hardware» more  VTS 2003»
14 years 3 months ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov
CASES
2003
ACM
14 years 3 months ago
Frequent loop detection using efficient non-intrusive on-chip hardware
Dynamic software optimization methods are becoming increasingly popular for improving software performance and power. The first step in dynamic optimization consists of detecting ...
Ann Gordon-Ross, Frank Vahid
PODC
2003
ACM
14 years 3 months ago
A lattice-theoretic characterization of safety and liveness
The distinction between safety and liveness properties is due to Lamport who gave the following informal characterization. Safety properties assert that nothing bad ever happens w...
Panagiotis Manolios, Richard J. Trefler
CP
2003
Springer
14 years 3 months ago
Solving Max-SAT as Weighted CSP
For the last ten years, a significant amount of work in the constraint community has been devoted to the improvement of complete methods for solving soft constraints networks. We ...
Simon de Givry, Javier Larrosa, Pedro Meseguer, Th...