Static timing analysis is a critical step in design of any digital integrated circuit. Technology and design trends have led to significant increase in environmental and process v...
Abstract— This paper proposes an approach to cope with temporal power/ground voltage fluctuation for static timing analysis. The proposed approach replaces temporal noise with a...
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
Whereas partial order methods have proved their efficiency for the analysis of discrete-event systems, their application to timed systems remains a challenging research topic. Here...