80 search results - page 14 / 16 » Compressing Functional Tests for Microprocessors |
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
EMSOFT
2005
Springer
14 years 26 days ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
JCIT
2010
13 years 2 months ago
2010
Artificial Neural Networks(ANNS) have top level of capability to progress the estimation of cracks in metal tubes. The aim of this paper is to propose an algorithm to identify mod...
CLEIEJ
2008
13 years 7 months ago
2008
A lot of material has been written about wavelet theory. Most of these texts provide an elegant framework from the functional and real analysis point of view. The complete infinit...
ICIP
1994
IEEE
14 years 8 months ago
1994
IEEE
Motion information is essential in many computer vision and video analysis tasks. Since MPEG is still one of the most prevalent formats for representing, transferring and storing ...