Spot noise and line integral convolution (LIC) are two texture synthesis techniques for vector field visualization. In this paper the two techniques are compared. Continuous direc...
Characterizing shared-memory applications provides insight to design efficient systems, and provides awareness to identify and correct application performance bottlenecks. Configu...
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
The last decade has seen a phenomenal increase in the use of electronic components in automotive systems, resulting in the replacement of purely mechanical or hydraulic-implementa...
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...