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VISUALIZATION
1998
IEEE
14 years 1 days ago
Comparing LIC and spot noise
Spot noise and line integral convolution (LIC) are two texture synthesis techniques for vector field visualization. In this paper the two techniques are compared. Continuous direc...
Wim C. de Leeuw, Robert van Liere
IPPS
1998
IEEE
14 years 2 days ago
Configuration Independent Analysis for Characterizing Shared-Memory Applications
Characterizing shared-memory applications provides insight to design efficient systems, and provides awareness to identify and correct application performance bottlenecks. Configu...
Gheith A. Abandah, Edward S. Davidson
DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
VLSID
2008
IEEE
191views VLSI» more  VLSID 2008»
14 years 2 months ago
Programming and Performance Modelling of Automotive ECU Networks
The last decade has seen a phenomenal increase in the use of electronic components in automotive systems, resulting in the replacement of purely mechanical or hydraulic-implementa...
Samarjit Chakraborty, Sethu Ramesh
ISQED
2006
IEEE
155views Hardware» more  ISQED 2006»
14 years 1 months ago
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
Bin Zhang, Wei-Shen Wang, Michael Orshansky