Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
The memory hierarchy of a system can consume up to 50% of microprocessor system power. Previous work has shown that tuning a configurable cache to a particular application can red...
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
As across-chip interconnect delays can exceed a clock cycle, wire pipelining becomes essential in high performance designs. Although it allows higher clock frequencies, it may cha...
This paper presents a technique for preprocessing combinational logic before technology mapping. The technique is based on the representation of combinational logic using And-Inve...
Alan Mishchenko, Satrajit Chatterjee, Robert K. Br...