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DAC
2009
ACM
14 years 8 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2007
ACM
14 years 8 months ago
A Self-Tuning Configurable Cache
The memory hierarchy of a system can consume up to 50% of microprocessor system power. Previous work has shown that tuning a configurable cache to a particular application can red...
Ann Gordon-Ross, Frank Vahid
DAC
2007
ACM
14 years 8 months ago
Confidence Scalable Post-Silicon Statistical Delay Prediction under Process Variations
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
Qunzeng Liu, Sachin S. Sapatnekar
DAC
2004
ACM
14 years 8 months ago
A method for correcting the functionality of a wire-pipelined circuit
As across-chip interconnect delays can exceed a clock cycle, wire pipelining becomes essential in high performance designs. Although it allows higher clock frequencies, it may cha...
Vidyasagar Nookala, Sachin S. Sapatnekar
DAC
2006
ACM
14 years 8 months ago
DAG-aware AIG rewriting a fresh look at combinational logic synthesis
This paper presents a technique for preprocessing combinational logic before technology mapping. The technique is based on the representation of combinational logic using And-Inve...
Alan Mishchenko, Satrajit Chatterjee, Robert K. Br...