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» Computing the Angularity Tolerance
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DAC
2009
ACM
14 years 11 months ago
Energy-aware error control coding for Flash memories
The use of Flash memories in portable embedded systems is ever increasing. This is because of the multi-level storage capability that makes them excellent candidates for high dens...
Veera Papirla, Chaitali Chakrabarti
DAC
2009
ACM
14 years 11 months ago
Decoding nanowire arrays fabricated with the multi-spacer patterning technique
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
M. Haykel Ben Jamaa, Yusuf Leblebici, Giovanni De ...
DAC
2009
ACM
14 years 11 months ago
Enabling adaptability through elastic clocks
Power and performance benefits of scaling are lost to worst case margins as uncertainty of device characteristics is increasing. Adaptive techniques can dynamically adjust the mar...
Emre Tuncer, Jordi Cortadella, Luciano Lavagno
DAC
2009
ACM
14 years 11 months ago
Fault models for embedded-DRAM macros
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
Ching-Yu Chin, Hao-Yu Yang, Mango Chia-Tso Chao, R...
DAC
2008
ACM
14 years 11 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego