1845 search results - page 355 / 369 » Computing the Angularity Tolerance |
DAC
2004
ACM
14 years 8 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
WWW
2004
ACM
14 years 8 months ago
2004
ACM
Centralized Resource Description Framework (RDF) repositories have limitations both in their failure tolerance and in their scalability. Existing Peer-to-Peer (P2P) RDF repositori...