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» Concurrent Java Test Generation as a Search Problem
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ECOOP
2007
Springer
13 years 11 months ago
Efficiently Generating Structurally Complex Inputs with Thousands of Objects
Abstract. We present Shekoosh, a novel framework for constraint-based generation of structurally complex inputs of large sizes. Given a Java predicate that represents the desired s...
Bassem Elkarablieh, Yehia Zayour, Sarfraz Khurshid
NAA
2000
Springer
104views Mathematics» more  NAA 2000»
13 years 11 months ago
A Grid Free Monte Carlo Algorithm for Solving Elliptic Boundary Value Problems
In this work a grid free Monte Carlo algorithm for solving elliptic boundary value problems is investigated. The proposed Monte Carlo approach leads to a random process called a ba...
Todor V. Gurov, Paula A. Whitlock, Ivan Dimov
ITC
1998
IEEE
120views Hardware» more  ITC 1998»
13 years 12 months ago
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer
IJCAI
2001
13 years 9 months ago
Solving Non-Boolean Satisfiability Problems with Stochastic Local Search
Much excitement has been generated by the success of stochastic local search procedures at finding solutions to large, very hard satisfiability problems. Many of the problems on wh...
Alan M. Frisch, Timothy J. Peugniez
CONSTRAINTS
2007
112views more  CONSTRAINTS 2007»
13 years 7 months ago
Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Francisco Azevedo