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» Concurrent Test Generation

114

Voted

VTS
1996
IEEE

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A new test pattern generation method for delay fault testing

15 years 8 months ago

A new test pattern generation method for delay fault testing

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S. Cremoux, Christophe Fagot, Patrick Girard, Chri...

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108

Voted

DAC
1992
ACM

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SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits

15 years 8 months ago

SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits

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Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer

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50

STVR
2008

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IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing

15 years 3 months ago

IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing

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Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun,...

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103

JISE
2000

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Compact Test Generation Using a Frozen Clock Testing Strategy

15 years 3 months ago

Compact Test Generation Using a Frozen Clock Testing Strategy

Download www.iis.sinica.edu.tw

Elizabeth M. Rudnick, Miron Abramovici

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140

TAP
2009
Springer

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Dynamic Symbolic Execution for Testing Distributed Objects

15 years 10 months ago

Dynamic Symbolic Execution for Testing Distributed Objects

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Abstract. This paper extends dynamic symbolic execution to distributed and concurrent systems. Dynamic symbolic execution can be used in software testing to systematically identify...

Andreas Griesmayer, Bernhard K. Aichernig, Einar B...

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