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» Concurrent Test Generation

29

VTS
1996
IEEE

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A new test pattern generation method for delay fault testing

14 years 18 days ago

A new test pattern generation method for delay fault testing

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S. Cremoux, Christophe Fagot, Patrick Girard, Chri...

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23

DAC
1992
ACM

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SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits

14 years 16 days ago

SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits

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Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer

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8

STVR
2008

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IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing

13 years 8 months ago

IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing

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Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun,...

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22

JISE
2000

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Compact Test Generation Using a Frozen Clock Testing Strategy

13 years 8 months ago

Compact Test Generation Using a Frozen Clock Testing Strategy

Download www.iis.sinica.edu.tw

Elizabeth M. Rudnick, Miron Abramovici

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32

TAP
2009
Springer

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Dynamic Symbolic Execution for Testing Distributed Objects

14 years 3 months ago

Dynamic Symbolic Execution for Testing Distributed Objects

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Abstract. This paper extends dynamic symbolic execution to distributed and concurrent systems. Dynamic symbolic execution can be used in software testing to systematically identify...

Andreas Griesmayer, Bernhard K. Aichernig, Einar B...

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