4299 search results - page 55 / 860 » Concurrent Test Generation |
144
Voted
ITC
1993
IEEE
15 years 6 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
114
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VLSID
2002
IEEE
16 years 2 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
162
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GLVLSI
2009
IEEE
15 years 5 days ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...
127
Voted
IWANN
2009
Springer
15 years 9 months ago
2009
Springer
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
149
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ICST
2009
IEEE
15 years 4 days ago
2009
IEEE
Under certain constraints the test case generation problem can be represented as a model checking problem, thus enabling the use of powerful model checking tools to perform the te...