4299 search results - page 58 / 860 » Concurrent Test Generation |
103
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ICSE
2010
IEEE-ACM
15 years 7 months ago
2010
IEEE-ACM
We present an approach for describing tests using nondeterministic test generation programs. To write such programs, we introduce UDITA, a Java-based language with non-determinist...
102
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VTS
2002
IEEE
15 years 7 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
101
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DATE
2002
IEEE
15 years 7 months ago
2002
IEEE
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set o...
121
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AOSD
2006
ACM
15 years 8 months ago
2006
ACM
Aspect-oriented software development is gaining popularity with the wider adoption of languages such as AspectJ. To reduce the manual effort of testing aspects in AspectJ programs...
125
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DATE
2002
IEEE
15 years 7 months ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...