An Optimal Algorithm for the Automatic Generation of March Tests

This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set of memory faults in very low computation time.

• Type: Conference
• Year: 2002
• Where: DATE
• Authors: Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto
• Keywords: DATE 2002, Hardware, Low Computation Time, March Test, Optimal March Test