4299 search results - page 61 / 860 » Concurrent Test Generation |
132
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DATE
1999
IEEE
15 years 6 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
133
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DATE
1997
IEEE
15 years 6 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
ACL
2006
15 years 3 months ago
2006
This paper introduces a method for the semi-automatic generation of grammar test items by applying Natural Language Processing (NLP) techniques. Based on manually-designed pattern...
127
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DATE
2009
IEEE
15 years 9 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
110
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ASPLOS
2010
ACM
15 years 9 months ago
2010
ACM
Multicore technology is making concurrent programs increasingly pervasive. Unfortunately, it is difficult to deliver reliable concurrent programs, because of the huge and non-det...