4299 search results - page 76 / 860 » Concurrent Test Generation |
120
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ICCAD
2002
IEEE
15 years 11 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
128
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ISSTA
2006
ACM
15 years 8 months ago
2006
ACM
The popularity of object-oriented programming has led to the wide use of container libraries. It is important for the reliability of these containers that they are tested adequate...
123
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ITC
1996
IEEE
15 years 6 months ago
1996
IEEE
This paper describes test generation for delay faults caused by global process disturbances. The structural and spatial correlation between path delays is used to reduce the numbe...
FATES
2003
Springer
15 years 7 months ago
2003
Springer
Abstract. In this paper we propose an approach to automatically produce test cases allowing to check the satis ability of a linear property on a given implementation. Linear proper...
ITC
1997
IEEE
15 years 6 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...