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130
Voted
DAC
1999
ACM
15 years 6 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
116
Voted
CORR
2004
Springer
15 years 2 months ago
2004
Springer
This paper presents Jartege, a tool which allows random generation of unit tests for Java classes specified in JML. JML (Java Modeling Language) is a specification language for Ja...
119
Voted
PEPM
2010
ACM
15 years 11 months ago
2010
ACM
PET is a prototype Partial Evaluation-based Test case generation tool for a subset of Java bytecode programs. It performs white-box test generation by means of two consecutive Par...
DATE
2005
IEEE
15 years 8 months ago
2005
IEEE
Abstract: With the increasing complexity of memory behavior, attempts are being made to come up with a methodical approach that employs electrical simulation to tackle the memory t...
116
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VTS
1999
IEEE
15 years 6 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...