4299 search results - page 95 / 860 » Concurrent Test Generation |
128
Voted
EVOW
2009
Springer
15 years 5 months ago
2009
Springer
Abstract. The testing of anomaly detectors is considered from the perspective of a Multi-objective Evolutionary Exploit Generator (EEG). Such a framework provides users of anomaly ...
137
click to vote
EVOW
2001
Springer
15 years 7 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
96
Voted
TVLSI
2008
15 years 2 months ago
2008
The proposed work involves conversion of a given circuit model into a set of constraints and employing constraint solvers to generate tests for it. The method is demonstrated for ...
115
Voted
DAC
2003
ACM
16 years 3 months ago
2003
ACM
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
114
Voted
ICCD
2004
IEEE
15 years 11 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...