— This work develops an analytic framework for clock tree analysis considering process variations that is shown to correspond well with Monte Carlo results. The analysis framewor...
Matthew R. Guthaus, Dennis Sylvester, Richard B. B...
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
Background: Tag-based techniques, such as SAGE, are commonly used to sample the mRNA pool of an organism's transcriptome. Incomplete digestion during the tag formation proces...
Russell L. Zaretzki, Michael A. Gilchrist, William...