49 search results - page 7 / 10 » Considering process variations during system-level power ana... |
112
Voted
ASPDAC
2006
ACM
15 years 9 months ago
2006
ACM
— This work develops an analytic framework for clock tree analysis considering process variations that is shown to correspond well with Monte Carlo results. The analysis framewor...
116
Voted
DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
144
Voted
ISQED
2008
IEEE
15 years 10 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
123
Voted
DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
122
Voted
BMCBI
2010
15 years 3 months ago
2010
Background: Tag-based techniques, such as SAGE, are commonly used to sample the mRNA pool of an organism's transcriptome. Incomplete digestion during the tag formation proces...