278 search results - page 55 / 56 » Constraint Models for the Covering Test Problem |
TCAD
2008
13 years 7 months ago
2008
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
LCTRTS
2010
Springer
14 years 2 months ago
2010
Springer
For its high overall cost during product development, program debugging is an important aspect of system development. Debugging is a hard and complex activity, especially in time-...
SIGMOD
2010
ACM
14 years 9 days ago
2010
ACM
Mining graph patterns in large networks is critical to a variety of applications such as malware detection and biological module discovery. However, frequent subgraphs are often i...
ICCAD
2003
IEEE
14 years 24 days ago
2003
IEEE
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
ICML
2005
IEEE
14 years 8 months ago
2005
IEEE
The Relevance Vector Machine (RVM) is a sparse approximate Bayesian kernel method. It provides full predictive distributions for test cases. However, the predictive uncertainties ...