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» Controlled-Load Limited Switch Dynamic Logic Circuit
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ITC
1998
IEEE
120views Hardware» more  ITC 1998»
13 years 11 months ago
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer
ICCAD
1998
IEEE
94views Hardware» more  ICCAD 1998»
13 years 11 months ago
Noise considerations in circuit optimization
Noise can cause digital circuits to switch incorrectly and thus produce spurious results. Noise can also have adverse power, timing and reliability e ects. Dynamic logic is partic...
Andrew R. Conn, Ruud A. Haring, Chandramouli Viswe...
CDES
2006
240views Hardware» more  CDES 2006»
13 years 9 months ago
Design of Low Power 4-Tap 8-Bit Adiabatic FIR Filter
Abstract-- Digital signal processing (DSP) is used to perform filtering, decimation and down conversion in common communications systems, like in oversampling analog to digital con...
Arun N. Chandorkar, Gurvinder Singh
CDES
2008
90views Hardware» more  CDES 2008»
13 years 9 months ago
Nanocompilation for the Cell Matrix Architecture
- The Cell Matrix Architecture is a massive array of dynamically self-configurable, uniformly connected, identical computational units. This architecture can enable efficient, prac...
Thomas Way, Rushikesh Katikar, Ch. Purushotham
VTS
2002
IEEE
138views Hardware» more  VTS 2002»
14 years 13 days ago
Test Power Reduction through Minimization of Scan Chain Transitions
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...