28 search results - page 5 / 6 » Convex delay models for transistor sizing |
SDM
2009
SIAM
14 years 4 months ago
2009
SIAM
In this paper, we study efficient closed pattern mining in a general framework of set systems, which are families of subsets ordered by set-inclusion with a certain structure, pro...
ISQED
2011
IEEE
12 years 10 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
ICCAD
1997
IEEE
13 years 10 months ago
1997
IEEE
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...
DATE
2009
IEEE
14 years 1 months ago
2009
IEEE
Abstract—Reliable and verifiable hardware, software and content usage metering (HSCM) are of primary importance for wide segments of e-commerce including intellectual property a...
JCP
2008
13 years 7 months ago
2008
Rapid increase in transistor density and operating frequency has led to the increase in power densities, exhibiting itself as a high temperature profile. The high temperature spots...