892 search results - page 13 / 179 » Coordinated Scan Detection |
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presen...
ICIP
2003
IEEE
14 years 10 months ago
2003
IEEE
In scanning photographs, receipts or other small objects users will often scan many at a time. It would be convenient to automatically detect that the scanned image consists of ma...
DFT
2005
IEEE
13 years 10 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
VTS
2003
IEEE
14 years 1 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
DAGSTUHL
2006
13 years 10 months ago
2006
6D SLAM (Simultaneous Localization and Mapping) or 6D Concurrent Localization and Mapping of mobile robots considers six degrees of freedom for the robot pose, namely, the x, y and...