It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presen...
In scanning photographs, receipts or other small objects users will often scan many at a time. It would be convenient to automatically detect that the scanned image consists of ma...
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
Samitha Samaranayake, Emil Gizdarski, Nodari Sitch...
6D SLAM (Simultaneous Localization and Mapping) or 6D Concurrent Localization and Mapping of mobile robots considers six degrees of freedom for the robot pose, namely, the x, y and...