In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...
Abstract-- In this paper, we propose an adaptive linear approach for time series modeling and steam line leakage detection. Weighted recursive least squares (WRLS) method is used f...
In CHES 2008 a generic side-channel distinguisher, Mutual Information, has been introduced to be independent of the relation between measurements and leakages as well as between le...
Amir Moradi, Nima Mousavi, Christof Paar, Mahmoud ...
In nanometer scaled CMOS devices significant increase in the subthreshold, the gate and the reverse biased junction band-toband-tunneling (BTBT) leakage, results in the large incr...