Background: In binary high-throughput screening projects where the goal is the identification of low-frequency events, beyond the obvious issue of efficiency, false positives and ...
A parallel computing approach for large-scale SPICE-accurate circuit simulation is described that is based on a new preconditioned iterative solver. The preconditioner involves the...
Heidi Thornquist, Eric R. Keiter, Robert J. Hoekst...
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...
A software product line can be used to implement a software product family that is a set of software products sharing common features. A natural implementation strategy for a softw...
Suppose that we are given a set of n elements d of which are “defective”. A group test can check for any subset, called a pool, whether it contains a defective. It is well know...