1401 search results - page 47 / 281 » Cost-Sensitive Test Strategies |
BMCBI
2006
13 years 9 months ago
2006
Background: In binary high-throughput screening projects where the goal is the identification of low-frequency events, beyond the obvious issue of efficiency, false positives and ...
ICCAD
2009
IEEE
13 years 6 months ago
2009
IEEE
A parallel computing approach for large-scale SPICE-accurate circuit simulation is described that is based on a new preconditioned iterative solver. The preconditioner involves the...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
SPLST
2003
13 years 10 months ago
2003
A software product line can be used to implement a software product family that is a set of software products sharing common features. A natural implementation strategy for a softw...
FCT
2009
Springer
14 years 3 months ago
2009
Springer
Suppose that we are given a set of n elements d of which are “defective”. A group test can check for any subset, called a pool, whether it contains a defective. It is well know...