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DATE
2008
IEEE
112views Hardware» more  DATE 2008»
15 years 10 months ago
An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
Paolo Bernardi, Matteo Sonza Reorda
111
Voted
SODA
2010
ACM
169views Algorithms» more  SODA 2010»
16 years 1 months ago
Efficiently Decodable Non-adaptive Group Testing
We consider the following "efficiently decodable" nonadaptive group testing problem. There is an unknown string x {0, 1}n with at most d ones in it. We are allowed to t...
Piotr Indyk, Hung Q. Ngo, Atri Rudra
149
Voted
SDM
2008
SIAM
138views Data Mining» more  SDM 2008»
15 years 5 months ago
Learning Markov Network Structure using Few Independence Tests
In this paper we present the Dynamic Grow-Shrink Inference-based Markov network learning algorithm (abbreviated DGSIMN), which improves on GSIMN, the state-ofthe-art algorithm for...
Parichey Gandhi, Facundo Bromberg, Dimitris Margar...
IROS
2007
IEEE
138views Robotics» more  IROS 2007»
15 years 10 months ago
Moth plume-tracing derived algorithm for identifying chemical source in near-shore ocean environments
– This paper derives a single chemical sensor based algorithm from the moth-inspired chemical plume strategies for identifying plume sources in fluid-advected environments. We ev...
Wei Li
ITC
2003
IEEE
141views Hardware» more  ITC 2003»
15 years 9 months ago
Testability Features of the Alpha 21364 Microprocessor
The custom testability strategy of the Alpha 21364, Hewlett-Packard’s most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT feature...
Scott Erlanger, Dilip K. Bhavsar, Richard A. Davie...