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DATE
2008
IEEE
112views Hardware» more  DATE 2008»
14 years 4 months ago
An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
Paolo Bernardi, Matteo Sonza Reorda
SODA
2010
ACM
169views Algorithms» more  SODA 2010»
14 years 7 months ago
Efficiently Decodable Non-adaptive Group Testing
We consider the following "efficiently decodable" nonadaptive group testing problem. There is an unknown string x {0, 1}n with at most d ones in it. We are allowed to t...
Piotr Indyk, Hung Q. Ngo, Atri Rudra
SDM
2008
SIAM
138views Data Mining» more  SDM 2008»
13 years 11 months ago
Learning Markov Network Structure using Few Independence Tests
In this paper we present the Dynamic Grow-Shrink Inference-based Markov network learning algorithm (abbreviated DGSIMN), which improves on GSIMN, the state-ofthe-art algorithm for...
Parichey Gandhi, Facundo Bromberg, Dimitris Margar...
IROS
2007
IEEE
138views Robotics» more  IROS 2007»
14 years 4 months ago
Moth plume-tracing derived algorithm for identifying chemical source in near-shore ocean environments
– This paper derives a single chemical sensor based algorithm from the moth-inspired chemical plume strategies for identifying plume sources in fluid-advected environments. We ev...
Wei Li
ITC
2003
IEEE
141views Hardware» more  ITC 2003»
14 years 3 months ago
Testability Features of the Alpha 21364 Microprocessor
The custom testability strategy of the Alpha 21364, Hewlett-Packard’s most recent Alpha microprocessor, builds upon its Alpha 21264 embedded core. Several additional DFT feature...
Scott Erlanger, Dilip K. Bhavsar, Richard A. Davie...