1944 search results - page 15 / 389 » Coupling-based Integration Testing |
ETS
2007
IEEE
14 years 1 months ago
2007
IEEE
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
SEUS
2007
IEEE
14 years 1 months ago
2007
IEEE
In this paper we present a distributed Hardware-in-the-Loop (HiL) simulation approach that supports the verification and validation activities in an integrated architecture as rec...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
Research in high-speed interconnect requires physical test to validate circuit models and design assumptions. At multi-Gbit/sec rates, physical implementations require custom circ...
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...