1944 search results - page 28 / 389 » Coupling-based Integration Testing |
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
ET
2002
13 years 7 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
ITC
2003
IEEE
14 years 25 days ago
2003
IEEE
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...
OOPSLA
2007
Springer
14 years 1 months ago
2007
Springer
This article describes the design and use of the CUTE C++ testing framework and its integration into the Eclipse C++ Development Tooling. Unit testing supports code quality and is...
GLVLSI
2003
IEEE
14 years 25 days ago
2003
IEEE
The current trends in high performance integrated circuits are towards faster and more powerful circuits in the giga-hertz range and even further. As the more complex Integrated C...