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ASPDAC
2008
ACM
115views Hardware» more  ASPDAC 2008»
15 years 4 months ago
GECOM: Test data compression combined with all unknown response masking
This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE
Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu...
JAR
2006
99views more  JAR 2006»
15 years 2 months ago
An Integrated Approach to High Integrity Software Verification
Using automated reasoning techniques, we tackle the niche activity of proving that a program is free from run-time exceptions. Such a property is particularly valuable in high inte...
Andrew Ireland, Bill J. Ellis, Andrew Cook, Roderi...
ISSAC
1995
Springer
93views Mathematics» more  ISSAC 1995»
15 years 5 months ago
Finding Roots of Unity Among Quotients of the Roots of an Integral Polynomial
We present an efficient algorithm for testing whether a given integral polynomial has two distinct roots a, B such that fflp is a root of unity. The test is based on results obtai...
Kazuhiro Yokoyama, Ziming Li, István Nemes
ICML
2007
IEEE
16 years 3 months ago
Discriminative learning for differing training and test distributions
We address classification problems for which the training instances are governed by a distribution that is allowed to differ arbitrarily from the test distribution--problems also ...
Michael Brückner, Steffen Bickel, Tobias Sche...
VTS
2000
IEEE
97views Hardware» more  VTS 2000»
15 years 6 months ago
A Low-Speed BIST Framework for High-Performance Circuit Testing
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev