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ASPDAC
2008
ACM
115views Hardware» more  ASPDAC 2008»
13 years 9 months ago
GECOM: Test data compression combined with all unknown response masking
This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE
Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu...
JAR
2006
99views more  JAR 2006»
13 years 7 months ago
An Integrated Approach to High Integrity Software Verification
Using automated reasoning techniques, we tackle the niche activity of proving that a program is free from run-time exceptions. Such a property is particularly valuable in high inte...
Andrew Ireland, Bill J. Ellis, Andrew Cook, Roderi...
ISSAC
1995
Springer
93views Mathematics» more  ISSAC 1995»
13 years 11 months ago
Finding Roots of Unity Among Quotients of the Roots of an Integral Polynomial
We present an efficient algorithm for testing whether a given integral polynomial has two distinct roots a, B such that fflp is a root of unity. The test is based on results obtai...
Kazuhiro Yokoyama, Ziming Li, István Nemes
ICML
2007
IEEE
14 years 8 months ago
Discriminative learning for differing training and test distributions
We address classification problems for which the training instances are governed by a distribution that is allowed to differ arbitrarily from the test distribution--problems also ...
Michael Brückner, Steffen Bickel, Tobias Sche...
VTS
2000
IEEE
97views Hardware» more  VTS 2000»
13 years 12 months ago
A Low-Speed BIST Framework for High-Performance Circuit Testing
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev