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DAC
2001
ACM
14 years 8 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
FORMATS
2009
Springer
14 years 2 months ago
Exploiting Timed Automata for Conformance Testing of Power Measurements
For software development, testing is still the primary choice for investigating the correctness of a system. Automated testing is of utmost importance to support continuous integra...
Matthias Woehrle, Kai Lampka, Lothar Thiele
OOPSLA
2007
Springer
14 years 1 months ago
From developer's head to developer tests: characterization, theories, and preventing one more bug
Unit testing frameworks like JUnit are a popular and effective way to prevent developer bugs. We are investigating two ways of building on these frameworks to prevent more bugs wi...
David Saff
ISSRE
2006
IEEE
14 years 1 months ago
A Systematic Approach to Generate Inputs to Test UML Design Models
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...
Trung T. Dinh-Trong, Sudipto Ghosh, Robert B. Fran...
ASPDAC
2007
ACM
101views Hardware» more  ASPDAC 2007»
13 years 11 months ago
Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses
Abstract--An integrated test scheduling methodology for multiprocessor System-on-Chips (SOC) utilizing the functional buses for test data delivery is described. The proposed method...
Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orail...