1944 search results - page 73 / 389 » Coupling-based Integration Testing |
UML
2000
Springer
13 years 11 months ago
2000
Springer
Software testing can only be formalized and quanti ed when a solid basis for test generation can be de ned. Tests are commonly generated from program source code, graphical models ...
ECAI
2010
Springer
13 years 8 months ago
2010
Springer
Answer-set programming (ASP) is a well-acknowledged paradigm for declarative problem solving, yet comparably little effort has been spent on the investigation of methods to support...
ICSM
2008
IEEE
14 years 2 months ago
2008
IEEE
Test-case prioritization is a typical scenario of regression testing, which plays an important role in software maintenance. With the popularity of Web Services, integrating Web S...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
ICCAD
2000
IEEE
14 years 3 days ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...